- 作 者：edited by Peter W. Hawkes
- 出 版 社：Academic Press
- 出版年份：2005
- ISBN：0120147785
- 标注页数：333 页
- PDF页数：349 页
请阅读订购服务说明与试读!
订购服务说明
1、本站所有的书默认都是PDF格式，该格式图书只能阅读和打印，不能再次编辑。
2、除分上下册或者多册的情况下，一般PDF页数一定要大于标注页数才建议下单购买。【本资源349 ≥333页】
图书下载及付费说明
1、所有的电子图书为PDF格式，支持电脑、手机、平板等各类电子设备阅读；可以任意拷贝文件到不同的阅读设备里进行阅读。
2、电子图书在提交订单后一般半小时内处理完成,最晚48小时内处理完成。(非工作日购买会延迟)
3、所有的电子图书都是原书直接扫描方式制作而成。
Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement&GUY GILBOA，NIR SOCHEN，AND YEHOSHUA Y.ZEEVI 3
Ⅰ.Overview of PDE-Based Processes 3
Ⅱ.Sharpening by the Axiomatic Approach 21
Ⅲ.Sharpening by the Variational Approach 46
Ⅳ.Complex Diffusion Processes 61
Ⅴ.Texture-Preserving Denoising 87
Ⅵ.Conclusion 103
References 104
The S-State Model for Electron Channeling in High-Resolution Electron Microscopy&P.GEUENS AND D.VAN DYCK 113
Ⅰ.Introduction 113
Ⅱ.The Channeling Theory 124
Ⅲ.Calculation of the Eigenfunctions of an Electron in an Isolated Atom Column 130
Ⅳ.The S-State Model 160
Ⅴ.The S-State Model for Nonisolated Atom Columns 175
Ⅵ.The S-State Model in Case of Crystal or Beam Tilt 191
Ⅶ.Experimental Channeling Maps 201
Ⅷ.Electron Diffraction and the S-State Model 203
References 223
Measurement of Electric Fields on Object Surface in an Emission Electron Microscope&S.A.NEPIJKO，N.N.SEDOV，AND G.SCHONHENSE 228
Ⅰ.Introduction 228
Ⅱ.Direct and Inverse Problems of Measurement of Electric Fields（Potential）on the Object Surface in Emission Electron Microscope 230
Ⅲ.Model Experiments on Mapping of Electric Fields （Potential）on the Object Surface Using an Emission Electron Microscope 252
Ⅳ.The Effect of the Local Fields and Microroughness at the Object on the Imaging and Resolving Power of an Emission Electron Microscope 262
Ⅴ.Practical Applications of Microfield Measurement Using an Emission Electron Microscope 278
Ⅵ.Measurement of Object Surface Geometry（Relief）with an Emission Electron Microscope 291
Ⅶ.Conclusions 312
References 313
Index 317